Correlating Multicrystalline Silicon Defect Types Using Photoluminescence, Defect-Band Emission, and Lock-in Thermography Imaging Techniques

Steve Johnston, Harvey Guthrey, Fei Yan, Katherine Zaunbrecher, Mowafak Al-Jassim, Pati Rakotoniaina, Martin Kaes

Research output: Contribution to journal › Article › peer-review

36 Scopus Citations

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