Correlation Between Measured Minority-Carrier Lifetime and Cu(In,Ga)Se2 Device Performance

Research output: Contribution to journal › Article › peer-review

Original language	American English
Number of pages	7
Journal	IEEE Transactions on Electron Devices
DOIs	https://doi.org/10.1109/TED.2010.2066130
State	Published - 2010

NLR Publication Number

@article{bfd42ddc32cd432ab9f513adc0e7747b,

title = "Correlation Between Measured Minority-Carrier Lifetime and Cu(In,Ga)Se2 Device Performance",

keywords = "cell measurement, cell material, charge carrier lifetime, photovoltaic, thin-film devices",

author = "Jian Li",

year = "2010",

doi = "10.1109/TED.2010.2066130",

language = "American English",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Correlation Between Measured Minority-Carrier Lifetime and Cu(In,Ga)Se2 Device Performance

AU - Li, Jian

PY - 2010

Y1 - 2010

KW - cell measurement, cell material

KW - charge carrier lifetime

KW - photovoltaic

KW - thin-film devices

UR - https://www.scopus.com/pages/publications/78049304720

U2 - 10.1109/TED.2010.2066130

DO - 10.1109/TED.2010.2066130

M3 - Article

SN - 0018-9383

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

ER -