Correlation between the Electronic Structures and Diffusion Paths of Interstitial Defects in Semiconductors: The Case of CdTe: Article No. 155208

Suhuai Wei, Jihui Yang, Juarez Da Silva

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number15
StatePublished - 2014

NREL Publication Number

  • NREL/JA-5K00-63513

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