Correlation of Advanced Accelerated Stress Testing with Polyamide-Based Photovoltaic Backsheet Field-Failures

Michael Owen-Bellini, David Miller, Donald Jenket, Peter Hacke, Laura Schelhas, Stephanie Moffitt, Ashley Maes, James Hartley, Todd Karin

Research output: Contribution to conferencePaperpeer-review

7 Scopus Citations


Cracking of polyamide (PA)-based photovoltaic (PV) backsheet materials has been widely reported for field-aged modules. Failure was not detected by conventional accelerated stress tests (ASTs), which lacked the necessary combination of stress factors and/or factor sequences. PA-based AAA backsheet cracking has since been reproduced through combined and sequential stress testing. Planar- and cross-sectional-optical microscopy as well as Fourier-transform Infrared Spectroscopy (FTIR), have been used to elucidate the mechanical and chemical changes which lead to failure of the backsheet. Field-aged backsheet samples demonstrating failure in various climates (including locations in China and Italy) are also analyzed. Through the analysis, a comparison is made between the different stress testing protocols and the field-aged samples to validate relevance of the advanced stress tests. It is shown that the changes induced through combined-accelerated stress testing (C-AST) were most representative of changes induced by the field, supporting the relevance of C-AST and providing validity for the test protocol.

Original languageAmerican English
Number of pages5
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019


Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NREL Publication Number

  • NREL/CP-5K00-74174


  • Backsheet
  • Combined-Accelerated Stress Testing
  • Cracking
  • Polyamide


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