Correlation of Capacitance-Voltage Hysteresis Measurements with Performance During Accelerated Lifetime Testing of Polycrystalline Thin Film Solar Cells

David Albin

doi:10.1109/IPFA.2010.5532249

Correlation of Capacitance-Voltage Hysteresis Measurements with Performance During Accelerated Lifetime Testing of Polycrystalline Thin Film Solar Cells

David Albin

Materials Science

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	6
DOIs	https://doi.org/10.1109/IPFA.2010.5532249
State	Published - 2010
Event	17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore Duration: 5 Jul 2010 → 9 Jul 2010

Conference

Conference	17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
City	Singapore
Period	5/07/10 → 9/07/10

NREL Publication Number

NREL/CP-520-48441

Keywords

device performance
polycrystalline thin film solar cells

Access to Document

10.1109/IPFA.2010.5532249

Cite this

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title = "Correlation of Capacitance-Voltage Hysteresis Measurements with Performance During Accelerated Lifetime Testing of Polycrystalline Thin Film Solar Cells",

keywords = "device performance, polycrystalline thin film solar cells",

author = "David Albin",

year = "2010",

doi = "10.1109/IPFA.2010.5532249",

language = "American English",

note = "17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ; Conference date: 05-07-2010 Through 09-07-2010",

}

TY - CONF

T1 - Correlation of Capacitance-Voltage Hysteresis Measurements with Performance During Accelerated Lifetime Testing of Polycrystalline Thin Film Solar Cells

AU - Albin, David

PY - 2010

Y1 - 2010

KW - device performance

KW - polycrystalline thin film solar cells

U2 - 10.1109/IPFA.2010.5532249

DO - 10.1109/IPFA.2010.5532249

M3 - Paper

T2 - 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Y2 - 5 July 2010 through 9 July 2010

ER -