Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties

Steve Johnston; Ingrid Repins; Rajalakshmi Sundaramoorthy; Kim M. Jones; Bobby To

doi:10.1109/PVSC.2010.5614124

Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties

Steve Johnston, Ingrid Repins, Rajalakshmi Sundaramoorthy, Kim M. Jones, Bobby To

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

5 Scopus Citations

Abstract

Several camera imaging techniques have been applied to the characterization of Cu(In,Ga)Se₂(CIGS) solar cells having a range of efficiencies. Photoluminescence (PL) imaging shows brightness variations after the deposition of the CIGS layer that persist through CdS deposition and subsequent processing steps to finish the devices. PL and electroluminescence imaging on finished cells show a correlation to the devices' corresponding efficiency and open-circuit voltage (V_OC), and dark defect-related spots correspond to bright spots on images from illuminated lock-in thermography (LIT) and forward-bias dark LIT. These image-detected defect areas are weak diodes and shunts. Imaging provides locations of defects detrimental to solar cell performance. Some of these defects are analyzed in more detail by scanning electron microscopy techniques using top and cross-sectional views.

Original language	American English
Pages	6-11
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2010.5614124 https://doi.org/10.1109/PVSC.2010.5614124
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/Territory	United States
City	Honolulu, HI
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-47703

Keywords

camera imaging techniques
defects
device performance
solar photovoltaics

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Johnston, S., Repins, I., Sundaramoorthy, R., Jones, K. M., & To, B. (2010). Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties. 6-11. Paper presented at 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States. https://doi.org/10.1109/PVSC.2010.5614124, https://doi.org/10.1109/PVSC.2010.5614124

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title = "Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties",

abstract = "Several camera imaging techniques have been applied to the characterization of Cu(In,Ga)Se2(CIGS) solar cells having a range of efficiencies. Photoluminescence (PL) imaging shows brightness variations after the deposition of the CIGS layer that persist through CdS deposition and subsequent processing steps to finish the devices. PL and electroluminescence imaging on finished cells show a correlation to the devices' corresponding efficiency and open-circuit voltage (VOC), and dark defect-related spots correspond to bright spots on images from illuminated lock-in thermography (LIT) and forward-bias dark LIT. These image-detected defect areas are weak diodes and shunts. Imaging provides locations of defects detrimental to solar cell performance. Some of these defects are analyzed in more detail by scanning electron microscopy techniques using top and cross-sectional views.",

keywords = "camera imaging techniques, defects, device performance, solar photovoltaics",

author = "Steve Johnston and Ingrid Repins and Rajalakshmi Sundaramoorthy and Jones, {Kim M.} and Bobby To",

year = "2010",

doi = "10.1109/PVSC.2010.5614124",

language = "American English",

pages = "6--11",

note = "35th IEEE Photovoltaic Specialists Conference, PVSC 2010 ; Conference date: 20-06-2010 Through 25-06-2010",

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Johnston, S , Repins, I, Sundaramoorthy, R, Jones, KM & To, B 2010, 'Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties', Paper presented at 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 20/06/10 - 25/06/10 pp. 6-11. https://doi.org/10.1109/PVSC.2010.5614124, https://doi.org/10.1109/PVSC.2010.5614124

Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties. / Johnston, Steve ; Repins, Ingrid; Sundaramoorthy, Rajalakshmi et al.
2010. 6-11 Paper presented at 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States.

Research output: Contribution to conference › Paper › peer-review

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AU - Johnston, Steve

AU - Repins, Ingrid

AU - Sundaramoorthy, Rajalakshmi

AU - Jones, Kim M.

AU - To, Bobby

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Correlations of Photo-Electro-Thermal-Luminescent Imaging of Cu(In,Ga)Se2 with Device Performance, Defects, and Micro-Structural Properties

Abstract

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Keywords

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