CPV Cell Infant Mortality Study: Preprint

Research output: Contribution to conferencePaper


Six hundred and fifty CPV cells were characterized before packaging and then after a four-hour concentrated on-sun exposure. An observed fielded infant mortality failure rate was reproduced and attributed to epoxy die-attach voiding at the corners of the cells. These voids increase the local thermal resistance allowing thermal runaway to occur under normal operation conditions in otherwisedefect-free cells. FEM simulations and experiments support this hypothesis. X-ray transmission imaging of the affected assemblies was not found capable of detecting all suspect voids and therefore cannot be considered a reliable screening technique in the case of epoxy die-attach.
Original languageAmerican English
Number of pages6
StatePublished - 2011
Event7th International Conference on Concentrating Photovoltaic Systems (CPV-7) - Las Vegas, Nevada
Duration: 4 Apr 20116 Apr 2011


Conference7th International Conference on Concentrating Photovoltaic Systems (CPV-7)
CityLas Vegas, Nevada

NREL Publication Number

  • NREL/CP-5200-51337


  • CPV
  • die-attach
  • multi-junction
  • photovoltaic
  • thermal runaway
  • void


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