Crystal Growth and Wafer Processing for High Yield and High Efficiency Solar Cells: Final Report, 1 October 2003 - 15 January 2008

Research output: NRELSubcontract Report

Abstract

Hardness, elastic modulus, and fracture toughness of low and high carrier-lietime regions in polycrystalline silicon were evaluated using the nanoindentation technique.
Original languageAmerican English
Number of pages8
StatePublished - 2008

Bibliographical note

Work performed by North Carolina State University, Raleigh, North Carolina

NREL Publication Number

  • NREL/SR-520-44375

Keywords

  • crystal growth
  • grain boundary (GBS)
  • high efficiency
  • high yield
  • light element impurities
  • nanoindentation
  • polycrystalline silicon
  • PV
  • solar cells
  • wafer process

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