Cu-Local Structures and Their Relation with Nanoscale Electrical Performance in CdTe

Eric Colegrove; Srisuda Rojsatien; Trumann Walker; Tara Nietzold; Barry Lai; Michael Stuckelberger; Arun Kanakkithodi; Maria Chan; Mariana Bertoni

doi:10.1109/PVSC45281.2020.9300779

Cu-Local Structures and Their Relation with Nanoscale Electrical Performance in CdTe

Eric Colegrove, Srisuda Rojsatien, Trumann Walker, Tara Nietzold, Barry Lai, Michael Stuckelberger, Arun Kanakkithodi, Maria Chan, Mariana Bertoni

Materials Science

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

For decades, copper has been introduced in CdTe devices to improve overall performance (open circuit voltage, fill factor, and series resistance). While multiple articles have reported on Cu-based defects, very little is known about how the local structure around the copper atom affects electrical performance. Using X-ray Absorption Near Edge Structure (XANES) coupled with X-ray microscopy we investigate good and poor performing region in Cu-doped CdTe devices. Our XANES coupled with theoretical standards by FEFF9 suggest that CU2Te phase and CuCdmay be responsible for the high electrical performance of the regions under study. This correlation of structure-performance at the nanoscale offers a unique framework to understand and tune processes with deep implications to the overall electrical performance of the solar cell.

Original language	American English
Pages	1547-1551
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC45281.2020.9300779 https://doi.org/10.1109/PVSC45281.2020.9300779
State	Published - 14 Jun 2020
Event	47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020

Conference

Conference	47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/Territory	Canada
City	Calgary
Period	15/06/20 → 21/08/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

NREL Publication Number

NREL/CP-5K00-79501

Keywords

CdTe
CuxTe XANES
FEFF9
XBIC

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Colegrove, E., Rojsatien, S., Walker, T., Nietzold, T., Lai, B., Stuckelberger, M., Kanakkithodi, A., Chan, M., & Bertoni, M. (2020). Cu-Local Structures and Their Relation with Nanoscale Electrical Performance in CdTe. 1547-1551. Paper presented at 47th IEEE Photovoltaic Specialists Conference, PVSC 2020, Calgary, Canada. https://doi.org/10.1109/PVSC45281.2020.9300779, https://doi.org/10.1109/PVSC45281.2020.9300779

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abstract = "For decades, copper has been introduced in CdTe devices to improve overall performance (open circuit voltage, fill factor, and series resistance). While multiple articles have reported on Cu-based defects, very little is known about how the local structure around the copper atom affects electrical performance. Using X-ray Absorption Near Edge Structure (XANES) coupled with X-ray microscopy we investigate good and poor performing region in Cu-doped CdTe devices. Our XANES coupled with theoretical standards by FEFF9 suggest that CU2Te phase and CuCdmay be responsible for the high electrical performance of the regions under study. This correlation of structure-performance at the nanoscale offers a unique framework to understand and tune processes with deep implications to the overall electrical performance of the solar cell.",

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author = "Eric Colegrove and Srisuda Rojsatien and Trumann Walker and Tara Nietzold and Barry Lai and Michael Stuckelberger and Arun Kanakkithodi and Maria Chan and Mariana Bertoni",

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doi = "10.1109/PVSC45281.2020.9300779",

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Colegrove, E, Rojsatien, S, Walker, T, Nietzold, T, Lai, B, Stuckelberger, M, Kanakkithodi, A, Chan, M & Bertoni, M 2020, 'Cu-Local Structures and Their Relation with Nanoscale Electrical Performance in CdTe', Paper presented at 47th IEEE Photovoltaic Specialists Conference, PVSC 2020, Calgary, Canada, 15/06/20 - 21/08/20 pp. 1547-1551. https://doi.org/10.1109/PVSC45281.2020.9300779, https://doi.org/10.1109/PVSC45281.2020.9300779

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AU - Colegrove, Eric

AU - Rojsatien, Srisuda

AU - Walker, Trumann

AU - Nietzold, Tara

AU - Lai, Barry

AU - Stuckelberger, Michael

AU - Kanakkithodi, Arun

AU - Chan, Maria

AU - Bertoni, Mariana

PY - 2020/6/14

Y1 - 2020/6/14

N2 - For decades, copper has been introduced in CdTe devices to improve overall performance (open circuit voltage, fill factor, and series resistance). While multiple articles have reported on Cu-based defects, very little is known about how the local structure around the copper atom affects electrical performance. Using X-ray Absorption Near Edge Structure (XANES) coupled with X-ray microscopy we investigate good and poor performing region in Cu-doped CdTe devices. Our XANES coupled with theoretical standards by FEFF9 suggest that CU2Te phase and CuCdmay be responsible for the high electrical performance of the regions under study. This correlation of structure-performance at the nanoscale offers a unique framework to understand and tune processes with deep implications to the overall electrical performance of the solar cell.

AB - For decades, copper has been introduced in CdTe devices to improve overall performance (open circuit voltage, fill factor, and series resistance). While multiple articles have reported on Cu-based defects, very little is known about how the local structure around the copper atom affects electrical performance. Using X-ray Absorption Near Edge Structure (XANES) coupled with X-ray microscopy we investigate good and poor performing region in Cu-doped CdTe devices. Our XANES coupled with theoretical standards by FEFF9 suggest that CU2Te phase and CuCdmay be responsible for the high electrical performance of the regions under study. This correlation of structure-performance at the nanoscale offers a unique framework to understand and tune processes with deep implications to the overall electrical performance of the solar cell.

KW - CdTe

KW - CuxTe XANES

KW - FEFF9

KW - XBIC

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U2 - 10.1109/PVSC45281.2020.9300779

DO - 10.1109/PVSC45281.2020.9300779

M3 - Paper

AN - SCOPUS:85099556171

SP - 1547

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T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020

Y2 - 15 June 2020 through 21 August 2020

ER -

Cu-Local Structures and Their Relation with Nanoscale Electrical Performance in CdTe

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

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