Cu(In,Ga)Se2 Based Submodule Process Robustness

doi:10.1109/PVSC.1996.564252

Cu(In,Ga)Se2 Based Submodule Process Robustness

Research output: Contribution to conference › Paper

Abstract

Submodule efforts have resulted in improved module design concepts as is demonstrated by: (1) a world record 13% conversion efficiency for a 40.4 cm/sup 2/ laminated 20 segment submodule, and (2) the ability to produce submodules of high FF (>70%) without other substantial losses relative to reference devices. The quality of our deposition systems for larger areas is tested and calibrated by theuse of 3x3 matrices of 3' x 3' substrates covering an area of over 500 cm/sup 2/. A high quality, high throughput (down to 10 min. deposition times) CIGS absorber processs is established and exhibits a high degree of controllability as well as tolerance to compositional fluctuations. Results of laser interconnect patterning are also shown.

Original language	American English
Pages	813-816
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1996.564252
State	Published - 1996
Event	Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996

Conference

Conference	Twenty Fifth IEEE Photovoltaic Specialists Conference
City	Washington, D.C.
Period	13/05/96 → 17/05/96

Bibliographical note

Work performed by Solarex, Newtown, Pennsylvania

NREL Publication Number

NREL/CP-22408

Access to Document

10.1109/PVSC.1996.564252

Cite this

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title = "Cu(In,Ga)Se2 Based Submodule Process Robustness",

abstract = "Submodule efforts have resulted in improved module design concepts as is demonstrated by: (1) a world record 13% conversion efficiency for a 40.4 cm/sup 2/ laminated 20 segment submodule, and (2) the ability to produce submodules of high FF (>70%) without other substantial losses relative to reference devices. The quality of our deposition systems for larger areas is tested and calibrated by theuse of 3x3 matrices of 3' x 3' substrates covering an area of over 500 cm/sup 2/. A high quality, high throughput (down to 10 min. deposition times) CIGS absorber processs is established and exhibits a high degree of controllability as well as tolerance to compositional fluctuations. Results of laser interconnect patterning are also shown.",

author = "NREL",

note = "Work performed by Solarex, Newtown, Pennsylvania; Twenty Fifth IEEE Photovoltaic Specialists Conference ; Conference date: 13-05-1996 Through 17-05-1996",

year = "1996",

doi = "10.1109/PVSC.1996.564252",

language = "American English",

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T1 - Cu(In,Ga)Se2 Based Submodule Process Robustness

AU - NREL, null

N1 - Work performed by Solarex, Newtown, Pennsylvania

PY - 1996

Y1 - 1996

N2 - Submodule efforts have resulted in improved module design concepts as is demonstrated by: (1) a world record 13% conversion efficiency for a 40.4 cm/sup 2/ laminated 20 segment submodule, and (2) the ability to produce submodules of high FF (>70%) without other substantial losses relative to reference devices. The quality of our deposition systems for larger areas is tested and calibrated by theuse of 3x3 matrices of 3' x 3' substrates covering an area of over 500 cm/sup 2/. A high quality, high throughput (down to 10 min. deposition times) CIGS absorber processs is established and exhibits a high degree of controllability as well as tolerance to compositional fluctuations. Results of laser interconnect patterning are also shown.

AB - Submodule efforts have resulted in improved module design concepts as is demonstrated by: (1) a world record 13% conversion efficiency for a 40.4 cm/sup 2/ laminated 20 segment submodule, and (2) the ability to produce submodules of high FF (>70%) without other substantial losses relative to reference devices. The quality of our deposition systems for larger areas is tested and calibrated by theuse of 3x3 matrices of 3' x 3' substrates covering an area of over 500 cm/sup 2/. A high quality, high throughput (down to 10 min. deposition times) CIGS absorber processs is established and exhibits a high degree of controllability as well as tolerance to compositional fluctuations. Results of laser interconnect patterning are also shown.

U2 - 10.1109/PVSC.1996.564252

DO - 10.1109/PVSC.1996.564252

M3 - Paper

SP - 813

EP - 816

T2 - Twenty Fifth IEEE Photovoltaic Specialists Conference

Y2 - 13 May 1996 through 17 May 1996

ER -

Cu(In,Ga)Se2 Based Submodule Process Robustness

Abstract

Conference

Bibliographical note

NREL Publication Number

Access to Document

Fingerprint

Cite this