Decay of the Electron-Beam-Induced Current in Hydrogenated Amorphous Silicon Devices

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)557-559
    Number of pages3
    JournalJournal of Applied Physics
    Volume56
    Issue number2
    DOIs
    StatePublished - 1984

    NREL Publication Number

    • ACNR/JA-213-3652

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