Deep-Level Transient Spectroscopy in InGaAsN Lattice-Matched to GaAs

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Deep-level transient spectroscopy (DLTS) measurements have been performed on the quaternary semi-conductor InGaAsN. A series of as-grown, metal-organic chemical vapor deposited samples having, varying composition were grown and measured. A GaAs sample was used as a baseline for comparison. After adding only In to GaAs, we did not detect significant additional defects; however, adding N and both N and In led to larger hole-trap peaks and additional electron-trap peaks in the DLTS data. The samples containing about 2% N, with and without about 6% In, had electron traps with activation energies of about 0.2 and 0.3 eV. A sample with 0.4% N had an electron trap with an activation energy of 0.37 eV.

Original languageAmerican English
Number of pages4
StatePublished - 2002
Event29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States
Duration: 19 May 200224 May 2002


Conference29th IEEE Photovoltaic Specialists Conference
Country/TerritoryUnited States
CityNew Orleans, LA

Bibliographical note

For preprint version including full text online document, see NREL/CP-520-31401

NREL Publication Number

  • NREL/CP-520-33728


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