@article{3f539b766fc24fd08e772da1b22c7d86,
title = "Defect Analysis of Thin Film Si-Based Alloys Deposited by Hot-Wire CVD Using Junction Capacitance Methods",
keywords = "amorphous materials, hot-wire depostion, optical spectroscopy, silicon germanium alloys, solar cells",
author = "NREL",
year = "2008",
doi = "10.1016/j.tsf.2007.06.116",
language = "American English",
volume = "516",
pages = "663--669",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier B.V.",
number = "5",
}