Defect Characterization by Admittance Spectroscopy Techniques Based on Temperature-Rate Duality

Yanfa Yan

doi:10.1109/PVSC.2010.5614469

Defect Characterization by Admittance Spectroscopy Techniques Based on Temperature-Rate Duality

Yanfa Yan

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	000239-000243
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2010.5614469
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-47713

Keywords

defects
solar cells
spectroscopy

Access to Document

10.1109/PVSC.2010.5614469

Cite this

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title = "Defect Characterization by Admittance Spectroscopy Techniques Based on Temperature-Rate Duality",

keywords = "defects, solar cells, spectroscopy",

author = "Yanfa Yan",

year = "2010",

doi = "10.1109/PVSC.2010.5614469",

language = "American English",

pages = "000239--000243",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC '10) ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Defect Characterization by Admittance Spectroscopy Techniques Based on Temperature-Rate Duality

AU - Yan, Yanfa

PY - 2010

Y1 - 2010

KW - defects

KW - solar cells

KW - spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=78650085030&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2010.5614469

DO - 10.1109/PVSC.2010.5614469

M3 - Paper

SP - 239

EP - 243

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -

Defect Characterization by Admittance Spectroscopy Techniques Based on Temperature-Rate Duality

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this