Defect-Driven Interfacial Electronic Structures at an Organic/Metal-Oxide Semiconductor Heterojunction

  • Paul Winget
  • , Laura K. Schirra
  • , David Cornil
  • , Hong Li
  • , Veaceslav Coropceanu
  • , Paul F. Ndione
  • , Ajaya K. Sigdel
  • , David S. Ginley
  • , Joseph J. Berry
  • , Jaewon Shim
  • , Hyungchui Kim
  • , Bernard Kippelen
  • , Jean Luc Brédas
  • , Oliver L.A. Monti

Research output: Contribution to journalArticlepeer-review

45 Scopus Citations

Abstract

The electronic structure of the hybrid interface between ZnO and the prototypical organic semiconductor PTCDI is investigated via a combination of ultraviolet and X-ray photoelectron spectroscopy (UPS/XPS) and density functional theory (DFT) calculations. The interfacial electronic interactions lead to a large interface dipole due to substantial charge transfer from ZnO to 3,4,9,10-perylenetetracarboxylicdiimide (PTCDI), which can be properly described only when accounting for surface defects that confer ZnO its n-type properties.

Original languageAmerican English
Pages (from-to)4711-4716
Number of pages6
JournalAdvanced Materials
Volume26
Issue number27
DOIs
StatePublished - 2014

NLR Publication Number

  • NREL/JA-5K00-62587

Keywords

  • interfacial electronic structure
  • organic semiconductor
  • PTCDI
  • surface defects
  • ZnO

Fingerprint

Dive into the research topics of 'Defect-Driven Interfacial Electronic Structures at an Organic/Metal-Oxide Semiconductor Heterojunction'. Together they form a unique fingerprint.

Cite this