Defect Monitoring Using Scanning Photoluminescence Spectroscopy in Multicrystalline Silicon Solar Cell

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Number of pages4
    StatePublished - 2000
    EventTwenty-Eighth IEEE Photovoltaic Specialists Conference 2000 - Anchorage, Alaska
    Duration: 15 Sep 200022 Sep 2000


    ConferenceTwenty-Eighth IEEE Photovoltaic Specialists Conference 2000
    CityAnchorage, Alaska

    Bibliographical note

    Work perfomed by University of South Florida, Tampa, Florida, and ASE Americas, Billerica, Massachusetts

    NREL Publication Number

    • NREL/CP-520-30314

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