Defect Monitoring Using Scanning Photoluminescence Spectroscopy in Multicrystalline Silicon Solar Cell

Defect Monitoring Using Scanning Photoluminescence Spectroscopy in Multicrystalline Silicon Solar Cell

Research output: Contribution to conference › Paper

Original language	American English
Pages	112-115
Number of pages	4
State	Published - 2000
Event	Twenty-Eighth IEEE Photovoltaic Specialists Conference 2000 - Anchorage, Alaska Duration: 15 Sep 2000 → 22 Sep 2000

Conference

Conference	Twenty-Eighth IEEE Photovoltaic Specialists Conference 2000
City	Anchorage, Alaska
Period	15/09/00 → 22/09/00

Bibliographical note

Work perfomed by University of South Florida, Tampa, Florida, and ASE Americas, Billerica, Massachusetts

NREL Publication Number

NREL/CP-520-30314

Cite this

@conference{37a411851d9943c094b27622d72dc013,

title = "Defect Monitoring Using Scanning Photoluminescence Spectroscopy in Multicrystalline Silicon Solar Cell",

author = "NREL",

note = "Work perfomed by University of South Florida, Tampa, Florida, and ASE Americas, Billerica, Massachusetts; Twenty-Eighth IEEE Photovoltaic Specialists Conference 2000 ; Conference date: 15-09-2000 Through 22-09-2000",

year = "2000",

language = "American English",

pages = "112--115",

}

TY - CONF

T1 - Defect Monitoring Using Scanning Photoluminescence Spectroscopy in Multicrystalline Silicon Solar Cell

AU - NREL, null

N1 - Work perfomed by University of South Florida, Tampa, Florida, and ASE Americas, Billerica, Massachusetts

PY - 2000

Y1 - 2000

M3 - Paper

SP - 112

EP - 115

T2 - Twenty-Eighth IEEE Photovoltaic Specialists Conference 2000

Y2 - 15 September 2000 through 22 September 2000

ER -