Defect Relaxation in Amorphous Silicon: Stretched Exponentials, the Meyer-Neidel Rule, and the Staebler-Wronski Effect

Research output: Contribution to journal › Article

NREL Publication Number

@article{84b440bb62674faa8ba79705cc6ef78e,

title = "Defect Relaxation in Amorphous Silicon: Stretched Exponentials, the Meyer-Neidel Rule, and the Staebler-Wronski Effect",

author = "NREL",

year = "1991",

doi = "10.1103/PhysRevB.43.4057",

language = "American English",

volume = "43",

pages = "4057--4070",

journal = "Physical Review B",

issn = "0163-1829",

publisher = "American Institute of Physics",

number = "5",

}