Degradation Analysis of Weathered Crystalline-Silicon PV Modules

C. R. Osterwald, A. Anderberg, S. Rummel, L. Ottoson

Research output: Contribution to conferencePaperpeer-review

114 Scopus Citations

Abstract

We present an analysis of the results of a solar weathering program that found a linear relationship between maximum power degradation and the total UV exposure dose for four different types of commercial crystalline Si modules. The average degradation rate for the four modules types was 0.71% per year. The analysis showed that losses of short-circuit current were responsible for the maximum power degradation. Judging by the appearance of the undegraded control modules, it is very doubtful that the short-circuit current losses were caused by encapsulation browning or obscuration. When we compared the quantum efficiency of a single cell in a degraded module to one from an unexposed control module, it appears that most of the degradation has occurred in the 800 - 1100 nm wavelength region, and not the short wavelength region.

Original languageAmerican English
Pages1392-1395
Number of pages4
StatePublished - 2002
Event29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States
Duration: 19 May 200224 May 2002

Conference

Conference29th IEEE Photovoltaic Specialists Conference
Country/TerritoryUnited States
CityNew Orleans, LA
Period19/05/0224/05/02

Bibliographical note

For preprint version including full text online document, see NREL/CP-520-31455

NREL Publication Number

  • NREL/CP-520-33733

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