Degradation and Capacitance-Voltage Hysteresis in CdTe Devices: Paper No. 741201

David Albin

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	12
DOIs	https://doi.org/10.1117/12.826471
State	Published - 2009
Event	SPIE Conference - San Diego, California Duration: 3 Aug 2009 → 6 Aug 2009

NREL Publication Number

@conference{4110a108f29e4f25b0b0f5d18462e741,

title = "Degradation and Capacitance-Voltage Hysteresis in CdTe Devices: Paper No. 741201",

keywords = "capacitance-voltage hysteresis, CdTe solar cell, degradation, DLTS, reliability, transient ion drift",

author = "David Albin",

year = "2009",

doi = "10.1117/12.826471",

language = "American English",

note = "SPIE Conference ; Conference date: 03-08-2009 Through 06-08-2009",

}