Degradation in PV Encapsulation Strength of Attachment: An Interlaboratory Study Towards a Climate-Specific Test: NREL (National Renewable Energy Laboratory)

David Miller, Michael Kempe, Eleonora Annigoni, Amal Ballion, Jayesh Bokria, Laura Bruckman, David Burns, Xinxin Chen, Jiangtao Feng, Roger French, Sean Fowler, Christian Honeker, Hussam Khonkar, Michael Kohl, Laure-Emmanuelle Perret-Aebi, Nancy Phillips, Kurt Scott, Fanny Sculati-Meillaud

Research output: NRELPresentation

Abstract

Reduced strength of attachment of the encapsulant resulting from the outdoor environment, including ultraviolet (UV) radiation, may decrease photovoltaic (PV) module lifetime by enabling widespread corrosion of internal components. To date, few studies exist showing how the adhesion of PV components varies with environmental stress. We have conducted an interlaboratory experiment to provide an understanding that will be used to develop climatic specific module tests. Factors examined in the study included the UV light source (lamp type), temperature, and humidity to be proposed for use in accelerated aging tests. A poly (ethylene-co-vinyl acetate) (EVA) formulation often used in veteran PV installations was studied using a compressive shear test - to quantify the strength of attachment at the EVA/glass interface. Replicate laminated glass/polymer/glass coupon specimens were weathered at 12 institutions using a variety of indoor chambers or field aging. Shear strength, shear strain, and toughness were measured using a mechanical load-frame for the compressive shear test, with subsequent optical imaging and electron microscopy of the separated surfaces.
Original languageAmerican English
Number of pages25
StatePublished - 2016

Publication series

NamePresented at the 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 5-10 June 2016, Portland, Oregon

NREL Publication Number

  • NREL/PR-5J00-66681

Keywords

  • degradation
  • durability
  • photovoltaic encapsulation
  • reliability
  • xenon

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