Degradation Kinetics of Hydrogenated Amorphous Silicon: The Effect of Embedded Microcrystallines

Degradation Kinetics of Hydrogenated Amorphous Silicon: The Effect of Embedded Microcrystallines

Research output: Contribution to conference › Paper

Original language	American English
Pages	729-734
Number of pages	6
State	Published - 1999
Event	Amorphous and Microcrystalline Silicon Technology 1998: Materials Research Society Symposium - San Francisco, California Duration: 14 Apr 1998 → 17 Apr 1998

Conference

Conference	Amorphous and Microcrystalline Silicon Technology 1998: Materials Research Society Symposium
City	San Francisco, California
Period	14/04/98 → 17/04/98

Bibliographical note

Work performed by University of Oregon, Eugene, Oregon and University of Illinois, Urbana, Illinois

NREL Publication Number

NREL/CP-520-27272

Cite this

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title = "Degradation Kinetics of Hydrogenated Amorphous Silicon: The Effect of Embedded Microcrystallines",

author = "NREL",

note = "Work performed by University of Oregon, Eugene, Oregon and University of Illinois, Urbana, Illinois; Amorphous and Microcrystalline Silicon Technology 1998: Materials Research Society Symposium ; Conference date: 14-04-1998 Through 17-04-1998",

year = "1999",

language = "American English",

pages = "729--734",

}

TY - CONF

T1 - Degradation Kinetics of Hydrogenated Amorphous Silicon: The Effect of Embedded Microcrystallines

AU - NREL, null

N1 - Work performed by University of Oregon, Eugene, Oregon and University of Illinois, Urbana, Illinois

PY - 1999

Y1 - 1999

M3 - Paper

SP - 729

EP - 734

T2 - Amorphous and Microcrystalline Silicon Technology 1998: Materials Research Society Symposium

Y2 - 14 April 1998 through 17 April 1998

ER -