Degradation Mechanisms in TOPCon/POLO Solar Cells

Research output: NRELPresentation


This presentation shows how Poly-Si/SiO2 contacts show a post firing degradation/regeneration cycle. The following conclusions were made: 1) cycle changes surface passivation (Jo), but not the bulk lifetime; 2) cycle time depends on anneal temperature in light or dark (higher T, faster cycle); 3) 400 degrees Celsius anneal eliminates the cycle - only generation occurs; 4) cycle time and magnitude is not correlated with Tfire; 5) contact passivation is stable after cycling; 6) fundamental nature of defect(s) responsible is not known; 7) TOPCon cells/modules, if constructed well, seem to show minimal degradation issues (PVEL, Jolywood, Jinko, ET Solar), and 8) NREL/ASU are studying TOPCon cells and UC Davis has a molecular dynamics model for TOPCon.
Original languageAmerican English
Number of pages23
StatePublished - 2023

Publication series

NamePresented at the 2023 Photovoltaic Reliability Workshop (PVRW), 28 February - 2 March 2023, Lakewood, Colorado

NREL Publication Number

  • NREL/PR-5900-85545


  • degradation
  • photovoltaic
  • POLO
  • poly Si/SiO2
  • polycrystalline silicon on oxide
  • PV
  • reliability
  • solar cell
  • TOPCon
  • tunnel oxide passivated contact


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