Degradation Modeling and Reliability Assessment of Capacitors: Paper No. IPACK2019-6456

Douglas DeVoto, Joshua Major, Anunay Gupta, Om Yadav, Arighna Roy

Research output: Contribution to conferencePaper

Abstract

The degradation of capacitors under accelerated stress conditions occur in a monotonic and non-linear fashion. Several efforts have been made to model the degradation behavior of capacitor considering either physics-of-failure models or statistical models and subsequently estimate its reliability and lifetime parameters. But most of these models fail to reflect the physical properties of the degradation path, which varies according to several intrinsic and extrinsic factors. These factors introduce random and temporal uncertainty among the population of capacitors. The gamma stochastic process can model both type of uncertainties among the population of capacitors. In this paper, we model the capacitor degradation by non-homogeneous gamma stochastic process in which both the model parameters (shape and scale) are dependent on stress variables. The model parameters are estimated using the maximum likelihood estimation approach.
Original languageAmerican English
Number of pages4
DOIs
StatePublished - 2019
EventASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - Anaheim, California
Duration: 7 Oct 20199 Oct 2019

Conference

ConferenceASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
CityAnaheim, California
Period7/10/199/10/19

NREL Publication Number

  • NREL/CP-5400-73968

Keywords

  • capacitors
  • data-driven modeling
  • degradation modeling
  • non-homogeneous gamma stochastic process
  • remaining useful life

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