Design of Ultra-Broadband Antireflection Coatings Utilizing Integrated Moth-Eye Structures for Multi-Junction Device Applications

Emmett E. Perl, Chieh Ting Lin, William E. McMahon, John E. Bowers, Daniel J. Friedman

Research output: Contribution to conferencePaperpeer-review

2 Scopus Citations

Abstract

Ultra-broadband Antireflection Coatings (ARCs) are essential to realizing the potential efficiency gains of four-junction photovoltaic devices that absorb to longer wavelengths than state-of-the-art three-junction cells. In this work, we examine a novel design that integrates a nanostructured antireflection layer with a multilayer ARC. Using optical models, we find that this hybrid approach can reduce the reflected AM1.5D power by 10-45 W/m2 compared to conventional thin-film ARCs. A hybrid ARC is designed and fabricated on a sample consisting of approximately 1μm of indium gallium phosphide (InGaP) on gallium arsenide (GaAs). For the hybrid coating, we measure a reflection loss of just 23.9 W/m2 corresponding to less than a 3% power reflection.

Original languageAmerican English
Pages1902-1906
Number of pages5
DOIs
StatePublished - 2013
Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
Duration: 16 Jun 201321 Jun 2013

Conference

Conference39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/TerritoryUnited States
CityTampa, FL
Period16/06/1321/06/13

NREL Publication Number

  • NREL/CP-5200-61950

Keywords

  • Biomimetics
  • III-V semiconductor materials
  • Nanophotonics
  • Optical films
  • Photovoltaic cells
  • Solar energy

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