Determination of the Critical Value of Xc for the Direct-to-Indirect Band-Gap Transition in AlxGa1-xAs by Measuring Hot-Carrier Dynamics in the X Valley

W. B. Wang, R. R. Alfano, D. Szmyd, A. J. Nozik

Research output: Contribution to journalArticlepeer-review

6 Scopus Citations

Fingerprint

Dive into the research topics of 'Determination of the Critical Value of Xc for the Direct-to-Indirect Band-Gap Transition in AlxGa1-xAs by Measuring Hot-Carrier Dynamics in the X Valley'. Together they form a unique fingerprint.

Material Science

Engineering