Determination of the Internal Series Resistance of CIS and CIGS Photovoltaic Cell Structures

doi:10.1109/PVSC.1996.564259

Determination of the Internal Series Resistance of CIS and CIGS Photovoltaic Cell Structures

Research output: Contribution to conference › Paper

Abstract

A new method is described to determine the internal series resistance of thin film solar cells. The method involves illumination of a small area of the cell with light insufficiently intense to make the internal resistance easily observable. For the CIS and CIGS cells examined, 3 x 10/sup -4/.omega. cm/sup 2/ were obtained. Such remarkably low values confirm the availability of CIGS to functionas a concentrator cell.

Original language	American English
Pages	841-844
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1996.564259
State	Published - 1996
Event	Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996

Conference

Conference	Twenty Fifth IEEE Photovoltaic Specialists Conference
City	Washington, D.C.
Period	13/05/96 → 17/05/96

Bibliographical note

Work performed by Energy Photovoltaics, Inc., Princeton, New Jersey and Princeton University, Princeton, New Jersey

NREL Publication Number

NREL/CP-22413

Access to Document

10.1109/PVSC.1996.564259

Cite this

@conference{4fa1a8b7a44540658ed9bef97eae567e,

title = "Determination of the Internal Series Resistance of CIS and CIGS Photovoltaic Cell Structures",

abstract = "A new method is described to determine the internal series resistance of thin film solar cells. The method involves illumination of a small area of the cell with light insufficiently intense to make the internal resistance easily observable. For the CIS and CIGS cells examined, 3 x 10/sup -4/.omega. cm/sup 2/ were obtained. Such remarkably low values confirm the availability of CIGS to functionas a concentrator cell.",

author = "NREL",

note = "Work performed by Energy Photovoltaics, Inc., Princeton, New Jersey and Princeton University, Princeton, New Jersey; Twenty Fifth IEEE Photovoltaic Specialists Conference ; Conference date: 13-05-1996 Through 17-05-1996",

year = "1996",

doi = "10.1109/PVSC.1996.564259",

language = "American English",

pages = "841--844",

}

TY - CONF

T1 - Determination of the Internal Series Resistance of CIS and CIGS Photovoltaic Cell Structures

AU - NREL, null

N1 - Work performed by Energy Photovoltaics, Inc., Princeton, New Jersey and Princeton University, Princeton, New Jersey

PY - 1996

Y1 - 1996

N2 - A new method is described to determine the internal series resistance of thin film solar cells. The method involves illumination of a small area of the cell with light insufficiently intense to make the internal resistance easily observable. For the CIS and CIGS cells examined, 3 x 10/sup -4/.omega. cm/sup 2/ were obtained. Such remarkably low values confirm the availability of CIGS to functionas a concentrator cell.

AB - A new method is described to determine the internal series resistance of thin film solar cells. The method involves illumination of a small area of the cell with light insufficiently intense to make the internal resistance easily observable. For the CIS and CIGS cells examined, 3 x 10/sup -4/.omega. cm/sup 2/ were obtained. Such remarkably low values confirm the availability of CIGS to functionas a concentrator cell.

U2 - 10.1109/PVSC.1996.564259

DO - 10.1109/PVSC.1996.564259

M3 - Paper

SP - 841

EP - 844

T2 - Twenty Fifth IEEE Photovoltaic Specialists Conference

Y2 - 13 May 1996 through 17 May 1996

ER -

Determination of the Internal Series Resistance of CIS and CIGS Photovoltaic Cell Structures

Abstract

Conference

Bibliographical note

NREL Publication Number

Access to Document

Fingerprint

Cite this