Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

Teresa Barnes; E. LeBlanc; M. Edirisooriya; O. Ogedengbe; O. Noriega; P. Jayathilaka; S. Rab; C. Swartz; D. Diercks; G. Burton; B. Gorman; A. Wang; T. Myers

doi:10.1007/s11664-017-5589-3

Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

Teresa Barnes, E. LeBlanc, M. Edirisooriya, O. Ogedengbe, O. Noriega, P. Jayathilaka, S. Rab, C. Swartz, D. Diercks, G. Burton, B. Gorman, A. Wang, T. Myers

Materials Science

Research output: Contribution to journal › Article › peer-review

12 Scopus Citations

Abstract

The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd_1−xMg_xTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd_1−xMg_xTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd_1−xMg_xTe double heterostructures is discussed. The stability of CdTe/Cd_1−xMg_xTe heterostructures are investigated with respect to thermal processing.

Original language	American English
Pages (from-to)	5379-5385
Number of pages	7
Journal	Journal of Electronic Materials
Volume	46
Issue number	9
DOIs	https://doi.org/10.1007/s11664-017-5589-3 https://doi.org/10.1007/s11664-017-5589-3
State	Published - 1 Sep 2017

Bibliographical note

Publisher Copyright:
© 2017, The Minerals, Metals & Materials Society.

NREL Publication Number

NREL/JA-5K00-68890

Keywords

band gap
diffusivity
elastic constants
II–VI semiconductor materials
Mg composition
semiconductor epitaxial layers

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Barnes, T., LeBlanc, E., Edirisooriya, M., Ogedengbe, O., Noriega, O., Jayathilaka, P., Rab, S., Swartz, C., Diercks, D., Burton, G., Gorman, B., Wang, A., & Myers, T. (2017). Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures. Journal of Electronic Materials, 46(9), 5379-5385. https://doi.org/10.1007/s11664-017-5589-3, https://doi.org/10.1007/s11664-017-5589-3

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abstract = "The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd1−xMgxTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd1−xMgxTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd1−xMgxTe double heterostructures is discussed. The stability of CdTe/Cd1−xMgxTe heterostructures are investigated with respect to thermal processing.",

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author = "Teresa Barnes and E. LeBlanc and M. Edirisooriya and O. Ogedengbe and O. Noriega and P. Jayathilaka and S. Rab and C. Swartz and D. Diercks and G. Burton and B. Gorman and A. Wang and T. Myers",

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doi = "10.1007/s11664-017-5589-3",

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Barnes, T, LeBlanc, E, Edirisooriya, M, Ogedengbe, O, Noriega, O, Jayathilaka, P, Rab, S, Swartz, C, Diercks, D, Burton, G, Gorman, B, Wang, A & Myers, T 2017, 'Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures', Journal of Electronic Materials, vol. 46, no. 9, pp. 5379-5385. https://doi.org/10.1007/s11664-017-5589-3, https://doi.org/10.1007/s11664-017-5589-3

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T1 - Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

AU - Barnes, Teresa

AU - LeBlanc, E.

AU - Edirisooriya, M.

AU - Ogedengbe, O.

AU - Noriega, O.

AU - Jayathilaka, P.

AU - Rab, S.

AU - Swartz, C.

AU - Diercks, D.

AU - Burton, G.

AU - Gorman, B.

AU - Wang, A.

AU - Myers, T.

PY - 2017/9/1

Y1 - 2017/9/1

N2 - The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd1−xMgxTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd1−xMgxTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd1−xMgxTe double heterostructures is discussed. The stability of CdTe/Cd1−xMgxTe heterostructures are investigated with respect to thermal processing.

AB - The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd1−xMgxTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd1−xMgxTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd1−xMgxTe double heterostructures is discussed. The stability of CdTe/Cd1−xMgxTe heterostructures are investigated with respect to thermal processing.

KW - band gap

KW - diffusivity

KW - elastic constants

KW - II–VI semiconductor materials

KW - Mg composition

KW - semiconductor epitaxial layers

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JF - Journal of Electronic Materials

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ER -

Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

Abstract

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Keywords

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