Abstract
The characterization of MOCVD-grown GaAs-AlGaAs materials and GaAs p+n junctions on poly-Ge substrates is presented. Minority carrier lifetime in GaAs-AlGaAs double-hetero (DH) structures grown on these substrates and the variation of lifetimes across different grain-structures are discussed. Minority-carrier diffusion lengths in polycrystalline GaAs p+-n junctions were evaluated bycross-sectional electron-beam induced current (EBIC) scans. The junctions were also studied by plan-view EBIC imaging. Optimization studies of GaAs solar cell on poly-Ge are discussed briefly. The effect of various polycrystalline substrate-induced defects on performance of GaAs solar cells are presented.
Original language | American English |
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Pages | 483-488 |
Number of pages | 6 |
State | Published - 1997 |
Event | Materials Research Society Symposium - Boston, Massachusetts Duration: 27 Nov 1995 → 1 Dec 1995 |
Conference
Conference | Materials Research Society Symposium |
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City | Boston, Massachusetts |
Period | 27/11/95 → 1/12/95 |
NREL Publication Number
- NREL/CP-22311