Development of in-situ High-Voltage and High-Temperature Stressing Capability on Atomic Force Microscopy Platform

Chuanxiao Xiao, Chun Sheng Jiang, Steven Johnston, Mowafak Al-Jassim, Xiaowu Yang, Jichun Ye, Brian Gorman

Research output: Contribution to journalArticlepeer-review

6 Scopus Citations

Fingerprint

Dive into the research topics of 'Development of in-situ High-Voltage and High-Temperature Stressing Capability on Atomic Force Microscopy Platform'. Together they form a unique fingerprint.

Engineering

Material Science