Development of Scanning Capacitance Spectroscopy of CIGS Solar Cells

Chuanxiao Xiao, Helio Moutinho, Chun Sheng Jiang, Bobby To, Mowafak Al-Jassim, Dean Levi, Yanfa Yan

Research output: Contribution to conferencePaperpeer-review

2 Scopus Citations


We successfully applied scanning capacitance spectroscopy (SCS) on CIGS solar cells. In SCS, a high-quality insulating layer is needed to block the AC and DC conductance between the probe and sample. A sample preparation procedure was developed on CIGS/CdS cross-sectional samples for optimal and reproducible results. Spectra taken with 10-nm intervals showed clear p- and n-type behaviors of CIGS and CdS, respectively. Rapid changes in spectra in the depletion region allowed us to locate the electrical junction with fine resolution of 10-30 nm.

Original languageAmerican English
Number of pages4
StatePublished - 14 Dec 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: 14 Jun 201519 Jun 2015


Conference42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
Country/TerritoryUnited States
CityNew Orleans

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

NREL Publication Number

  • NREL/CP-5K00-63589


  • CIGS
  • cross-section
  • depletion region
  • junction
  • resolution
  • sample preparation
  • Scanning capacitance


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