Development of Testing Methods to Predict Cracking in Photovoltaic Backsheets

Michael Kempe, Trevor Lockman, Joshua Morse

Research output: Contribution to conferencePaperpeer-review

15 Scopus Citations


In recent years there have been some significant failures of photovoltaic backsheets resulting from inadequacies of design that are not detected in current versions of the qualification standards. In some cases, this has resulted in catastrophic failure in less than 5 y of deployment. In this work, we develop a test sample construction and evaluate accelerated exposure conditions necessary to duplicate the cracking field failure of backsheets using a small and manageable coupon. This sample uses a piece of solder wire to put some controlled topology and stress into the backsheet. Through exposure to different environmental stressors it was found that the application of thermal cycling stresses, after ultraviolet radiation exposure, is of primary importance to duplicate field failures.

Original languageAmerican English
Number of pages6
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019


Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

NREL Publication Number

  • NREL/CP-5K00-73174


  • backsheet
  • cracking
  • polyamide
  • TC
  • thermo cycling
  • ultraviolet
  • UV


Dive into the research topics of 'Development of Testing Methods to Predict Cracking in Photovoltaic Backsheets'. Together they form a unique fingerprint.

Cite this