Developments for Novel Module Architecture for Lower CapEx and Improved Recyclability for c-Si PV Modules

Ryan Ruhle, Larry Maple, David Durney, Steve Johnston, Dana Kern, Walajabad Sampath

Research output: Contribution to conferencePaper

Abstract

Photovoltaic (PV) energy production is currently increasing at a significant rate. A novel module architecture has been demonstrated that has potential for reducing manufacturing cost while improving module reliability and recycling for c-Si PV which utilizes an edge-seal. Referred to as Edge Sealed Module (ESM), this architecture eliminates the vacuum lamination process and cross-linked encapsulants on the interior of the module. Functioning prototypes of c-Si have been fabricated for stress testing in collaboration with National Renewable Energy Laboratories (NREL). These modules are being tested and compared to traditionally manufactured modules. Based on preliminary results, this module architecture is a potentially viable solution for improving the manufacturing cost and recyclability of PV modules while enhancing module performance.
Original languageAmerican English
Pages820-824
Number of pages5
DOIs
StatePublished - 2024
Event2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) - Seattle, Washington
Duration: 9 Jun 202414 Jun 2024

Conference

Conference2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC)
CitySeattle, Washington
Period9/06/2414/06/24

NREL Publication Number

  • NREL/CP-5K00-92709

Keywords

  • costs
  • manufacturing
  • photovoltaic systems
  • prototypes
  • recycling
  • reliability
  • renewable energy sources
  • stress
  • testing
  • vacuum arcs

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