Device and Materials Characterization in Manufacturing

J. Sites, J. Rand, L. L. Kazmerski, J. E. Phillips

Research output: Contribution to journalArticlepeer-review

Abstract

Diagnostic measurements of thin-film materials and complete devices and solar modules are necessary to optimize both the processes and the resulting modules. Measurements provide the connection between processing and performance. In this workshop, the panel and audience examined both in situ and post-processing diagnostic measurements and how they can be utilized in a manufacturing environment to monitor processes and performance. The need for future measurement technology is increasingly for on-site, manufacturing-compatible, non-contact techniques giving rapid feedback in the production environment.

NREL Publication Number

  • NREL/JA-520-24538

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