Dielectric Function Spectra at 40 K and Critical-Point Energies for CuIn0.7Ga0.3Se2

S. G. Choi, R. Chen, C. Persson, T. J. Kim, S. Y. Hwang, Y. D. Kim, L. M. Mansfield

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We report ellipsometrically determined dielectric function ε spectra for CuIn0.7Ga0.3Se2 thin film at 40 and 300 K. The data exhibit numerous spectral features associated with interband critical points (CPs) in the spectral range from 0.74 to 6.43 eV. The second-energy-derivatives of ε further reveal a total of twelve above-bandgap CP features, whose energies are obtained accurately by a standard lineshape analysis. The ε spectra determined by ellipsometry show a good agreement with the results of full-potential linearized augmented plane wave calculations. Probable electronic origins of the CP features observed are discussed.

Original languageAmerican English
Article number261903
Number of pages4
JournalApplied Physics Letters
Issue number26
StatePublished - 24 Dec 2012

NREL Publication Number

  • NREL/JA-5200-55488


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