Dielectric Relaxation Contribution to Dispersion of Junction Admittance

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)1033-1044
    Number of pages12
    JournalSolid State Electronics
    Volume25
    Issue number10
    DOIs
    StatePublished - 1982

    Bibliographical note

    Work performed by Lockheed Palo Alto Research Laboratory, Palo Alto, California

    NREL Publication Number

    • ACNR/JA-3932

    Cite this