Original language | American English |
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Pages | 35-49 |
Number of pages | 15 |
State | Published - 1994 |
Event | Role of Point Defects and Defect Complexes in Silicon Device Processing: Third Workshop - Vail, Colorado Duration: 16 Aug 1993 → 18 Aug 1993 |
Conference
Conference | Role of Point Defects and Defect Complexes in Silicon Device Processing: Third Workshop |
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City | Vail, Colorado |
Period | 16/08/93 → 18/08/93 |
Bibliographical note
Work performed by Department of Mechanical Engineering and Materials Science, Duke University, Durham, North CarolinaNREL Publication Number
- ACNR/CP-15589