Digital Deep Level Transient Spectroscopy Considered for Discrimination of Traps Closely Spaced in Emission Coefficients in Semiconductors

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)187-191
    Number of pages5
    JournalJournal of Electronic Materials
    Issue number2
    StatePublished - 1988

    Bibliographical note

    Work performed by Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania

    NREL Publication Number

    • ACNR/JA-10439

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