Digital Deep Level Transient Spectroscopy Considered for Discrimination of Traps Closely Spaced in Emission Coefficients in Semiconductors

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	187-191
Number of pages	5
Journal	Journal of Electronic Materials
Volume	17
Issue number	2
DOIs	https://doi.org/10.1007/BF02652150
State	Published - 1988

Work performed by Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania

NREL Publication Number

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title = "Digital Deep Level Transient Spectroscopy Considered for Discrimination of Traps Closely Spaced in Emission Coefficients in Semiconductors",

author = "NREL",

note = "Work performed by Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania",

year = "1988",

doi = "10.1007/BF02652150",

language = "American English",

volume = "17",

pages = "187--191",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer New York",

number = "2",

}

TY - JOUR

T1 - Digital Deep Level Transient Spectroscopy Considered for Discrimination of Traps Closely Spaced in Emission Coefficients in Semiconductors

AU - NREL, null

N1 - Work performed by Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania

PY - 1988

Y1 - 1988

U2 - 10.1007/BF02652150

DO - 10.1007/BF02652150

M3 - Article

SN - 0361-5235

VL - 17

SP - 187

EP - 191

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 2

ER -