Direct Analysis of the Current-Voltage Curves of Outdoor-Degrading Modules

Dirk Jordan; Sarah Kurtz; Carolin Ulbrich; Marzella Goerig; Andreas Gerber; Uwe Rau

doi:10.1109/PVSC.2014.6925527

Direct Analysis of the Current-Voltage Curves of Outdoor-Degrading Modules

Dirk Jordan, Sarah Kurtz, Carolin Ulbrich, Marzella Goerig, Andreas Gerber, Uwe Rau

Materials Science

Joint Research Centre

Research output: Contribution to conference › Paper › peer-review

Abstract

We apply a phenomenological four-parameter equation to fit and analyze regularly measured current density-voltage JV curves of various technologies. The physically meaningful four parameters, short-circuit current density J_sc, open-circuit voltage V_oc, and differential resistances Rsc and Roc are determined for one-week data intervals of an exemplarily chosen CdTe module during 2.5 years of outdoor operation. For the chosen thin-film module, the fill factor FF degradation outweighs the degradation of J_sc and V_oc. Interestingly, the V_oc vs. log(J_sc) curves of the module at low irradiation unveil an increasing influence of a double-exponential diode behavior. The data hint at an increasing voltage-dependent charge-carrier collection in CdTe.

Original language	American English
Pages	2856-2861
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2014.6925527 https://doi.org/10.1109/PVSC.2014.6925527
State	Published - 15 Oct 2014
Event	40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: 8 Jun 2014 → 13 Jun 2014

Conference

Conference	40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country/Territory	United States
City	Denver
Period	8/06/14 → 13/06/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

NREL Publication Number

NREL/CP-5J00-61306

Keywords

CdTe
degradation
diode ideality
IV curve
monitoring
photovoltaic modules

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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abstract = "We apply a phenomenological four-parameter equation to fit and analyze regularly measured current density-voltage JV curves of various technologies. The physically meaningful four parameters, short-circuit current density Jsc, open-circuit voltage Voc, and differential resistances Rsc and Roc are determined for one-week data intervals of an exemplarily chosen CdTe module during 2.5 years of outdoor operation. For the chosen thin-film module, the fill factor FF degradation outweighs the degradation of Jsc and Voc. Interestingly, the Voc vs. log(Jsc) curves of the module at low irradiation unveil an increasing influence of a double-exponential diode behavior. The data hint at an increasing voltage-dependent charge-carrier collection in CdTe.",

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AU - Jordan, Dirk

AU - Kurtz, Sarah

AU - Ulbrich, Carolin

AU - Goerig, Marzella

AU - Gerber, Andreas

AU - Rau, Uwe

PY - 2014/10/15

Y1 - 2014/10/15

N2 - We apply a phenomenological four-parameter equation to fit and analyze regularly measured current density-voltage JV curves of various technologies. The physically meaningful four parameters, short-circuit current density Jsc, open-circuit voltage Voc, and differential resistances Rsc and Roc are determined for one-week data intervals of an exemplarily chosen CdTe module during 2.5 years of outdoor operation. For the chosen thin-film module, the fill factor FF degradation outweighs the degradation of Jsc and Voc. Interestingly, the Voc vs. log(Jsc) curves of the module at low irradiation unveil an increasing influence of a double-exponential diode behavior. The data hint at an increasing voltage-dependent charge-carrier collection in CdTe.

AB - We apply a phenomenological four-parameter equation to fit and analyze regularly measured current density-voltage JV curves of various technologies. The physically meaningful four parameters, short-circuit current density Jsc, open-circuit voltage Voc, and differential resistances Rsc and Roc are determined for one-week data intervals of an exemplarily chosen CdTe module during 2.5 years of outdoor operation. For the chosen thin-film module, the fill factor FF degradation outweighs the degradation of Jsc and Voc. Interestingly, the Voc vs. log(Jsc) curves of the module at low irradiation unveil an increasing influence of a double-exponential diode behavior. The data hint at an increasing voltage-dependent charge-carrier collection in CdTe.

KW - CdTe

KW - degradation

KW - diode ideality

KW - IV curve

KW - monitoring

KW - photovoltaic modules

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DO - 10.1109/PVSC.2014.6925527

M3 - Paper

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T2 - 40th IEEE Photovoltaic Specialist Conference, PVSC 2014

Y2 - 8 June 2014 through 13 June 2014

ER -

Direct Analysis of the Current-Voltage Curves of Outdoor-Degrading Modules

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

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