Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Junho Kim; Seongyeon Kim; Chun Sheng Jiang; Kannan Ramanathan; Mowafak M. Al-Jassim

doi:10.1063/1.4864758

Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Junho Kim, Seongyeon Kim, Chun Sheng Jiang, Kannan Ramanathan, Mowafak M. Al-Jassim

Materials Science

Research output: Contribution to journal › Article › peer-review

9 Scopus Citations

Abstract

We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se₂ solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

Original language	American English
Article number	063902
Number of pages	5
Journal	Applied Physics Letters
Volume	104
Issue number	6
DOIs	https://doi.org/10.1063/1.4864758 https://doi.org/10.1063/1.4864758
State	Published - 2 Oct 2014

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© 2014 AIP Publishing LLC.

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NREL/JA-5200-61939

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@article{a1886fbd6b5c4fc8985b88a37d303f03,

title = "Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells",

abstract = "We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.",

author = "Junho Kim and Seongyeon Kim and Jiang, {Chun Sheng} and Kannan Ramanathan and Al-Jassim, {Mowafak M.}",

note = "Publisher Copyright: {\textcopyright} 2014 AIP Publishing LLC.",

year = "2014",

month = oct,

day = "2",

doi = "10.1063/1.4864758",

language = "American English",

volume = "104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "6",

}

TY - JOUR

T1 - Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

AU - Kim, Junho

AU - Kim, Seongyeon

AU - Jiang, Chun Sheng

AU - Ramanathan, Kannan

AU - Al-Jassim, Mowafak M.

PY - 2014/10/2

Y1 - 2014/10/2

N2 - We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

AB - We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

UR - http://www.scopus.com/inward/record.url?scp=84937031607&partnerID=8YFLogxK

U2 - 10.1063/1.4864758

DO - 10.1063/1.4864758

M3 - Article

AN - SCOPUS:84937031607

SN - 0003-6951

VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 6

M1 - 063902

ER -

Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Abstract

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