Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Junho Kim; Seongyeon Kim; Chun Sheng Jiang; Kannan Ramanathan; Mowafak M. Al-Jassim

doi:10.1063/1.4864758

Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Junho Kim
, Seongyeon Kim
, Chun Sheng Jiang
, Kannan Ramanathan
, Mowafak M. Al-Jassim

Materials Science

Research output: Contribution to journal › Article › peer-review

9 Scopus Citations

Abstract

We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se₂ solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

Original language	American English
Article number	063902
Number of pages	5
Journal	Applied Physics Letters
Volume	104
Issue number	6
DOIs	https://doi.org/10.1063/1.4864758 https://doi.org/10.1063/1.4864758
State	Published - 2 Oct 2014

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© 2014 AIP Publishing LLC.

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NREL/JA-5200-61939

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title = "Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells",

abstract = "We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.",

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AU - Kim, Junho

AU - Kim, Seongyeon

AU - Jiang, Chun Sheng

AU - Ramanathan, Kannan

AU - Al-Jassim, Mowafak M.

PY - 2014/10/2

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N2 - We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

AB - We report on direct imaging of current collection by performing conductive atomic force microscopy (C-AFM) measurement on a complete Cu(In,Ga)Se2 solar cell. The localized current was imaged by milling away the top conductive layer of the device by repeated C-AFM scans. The result exhibits enhanced photocurrent collection on grain boundaries (GBs) of CIGS films, consistent with the argument for electric-field-assisted carrier collection on the GBs.

UR - https://www.scopus.com/pages/publications/84937031607

U2 - 10.1063/1.4864758

DO - 10.1063/1.4864758

M3 - Article

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JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Direct Imaging of Enhanced Current Collection on Grain Boundaries of Cu(In,Ga)Se2 Solar Cells

Abstract

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