Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

D. L. Young; T. J. Coutts; V. I. Kaydanov; A. S. Gilmore; W. P. Mulligan

doi:10.1116/1.1290372

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

D. L. Young, T. J. Coutts, V. I. Kaydanov, A. S. Gilmore, W. P. Mulligan

Chemistry and Nanoscience

Research output: Contribution to journal › Article › peer-review

106 Scopus Citations

Abstract

The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.

Original language	American English
Pages (from-to)	2978-2985
Number of pages	8
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	18
Issue number	6
DOIs	https://doi.org/10.1116/1.1290372 https://doi.org/10.1116/1.1290372
State	Published - 2000

NREL Publication Number

NREL/JA-520-29561

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Young, D. L., Coutts, T. J., Kaydanov, V. I., Gilmore, A. S., & Mulligan, W. P. (2000). Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 18(6), 2978-2985. https://doi.org/10.1116/1.1290372, https://doi.org/10.1116/1.1290372

@article{40c312a7fc034892aa5481e9ed7a9cf2,

title = "Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena",

abstract = "The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.",

author = "Young, {D. L.} and Coutts, {T. J.} and Kaydanov, {V. I.} and Gilmore, {A. S.} and Mulligan, {W. P.}",

year = "2000",

doi = "10.1116/1.1290372",

language = "American English",

volume = "18",

pages = "2978--2985",

journal = "Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films",

issn = "0734-2101",

publisher = "AVS Science and Technology Society",

number = "6",

}

Young, DL, Coutts, TJ, Kaydanov, VI, Gilmore, AS & Mulligan, WP 2000, 'Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, vol. 18, no. 6, pp. 2978-2985. https://doi.org/10.1116/1.1290372, https://doi.org/10.1116/1.1290372

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena. / Young, D. L.; Coutts, T. J.; Kaydanov, V. I. et al.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 18, No. 6, 2000, p. 2978-2985.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

AU - Young, D. L.

AU - Coutts, T. J.

AU - Kaydanov, V. I.

AU - Gilmore, A. S.

AU - Mulligan, W. P.

PY - 2000

Y1 - 2000

N2 - The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.

AB - The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.

UR - http://www.scopus.com/inward/record.url?scp=0034315435&partnerID=8YFLogxK

U2 - 10.1116/1.1290372

DO - 10.1116/1.1290372

M3 - Article

AN - SCOPUS:0034315435

SN - 0734-2101

VL - 18

SP - 2978

EP - 2985

JO - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

JF - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

IS - 6

ER -

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

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