Direct Observation of Na and O Impurities at Grain Surfaces of CuInSe2 Thin Films

David W. Niles, Mowafak Al-Jassim, Kannan Ramanathan

Research output: Contribution to journalArticlepeer-review

102 Scopus Citations

Abstract

The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.

Original languageAmerican English
Pages (from-to)291-296
Number of pages6
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume17
Issue number1
DOIs
StatePublished - 1999

NREL Publication Number

  • NREL/JA-520-26557

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