Direct Observation of Na and O Impurities at Grain Surfaces of CuInSe2 Thin Films

David W. Niles; Mowafak Al-Jassim; Kannan Ramanathan

doi:10.1116/1.581583

Direct Observation of Na and O Impurities at Grain Surfaces of CuInSe2 Thin Films

David W. Niles, Mowafak Al-Jassim, Kannan Ramanathan

Materials Science

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104 Scopus Citations

Abstract

The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe₂ thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe₂ (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.

Original language	American English
Pages (from-to)	291-296
Number of pages	6
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	17
Issue number	1
DOIs	https://doi.org/10.1116/1.581583 https://doi.org/10.1116/1.581583
State	Published - 1999

NREL Publication Number

NREL/JA-520-26557

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title = "Direct Observation of Na and O Impurities at Grain Surfaces of CuInSe2 Thin Films",

abstract = "The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.",

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PY - 1999

Y1 - 1999

N2 - The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.

AB - The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na.

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JF - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

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Direct Observation of Na and O Impurities at Grain Surfaces of CuInSe2 Thin Films

Abstract

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