Abstract
Bismuth-derived resonant states with T2 symmetry are detected in the valence band of GaAs1-xBix using electromodulated reflectance. A doublet is located 42 meV below the valence-band edge of GaAs that is split by local strain around isolated Bi impurity atoms. A transition associated with a singlet is also observed just above the GaAs spin-orbit split-off band. These states move deeper into the valence band with increasing Bi concentration but at a much slower rate than the well-known giant upward movement of the valence-band edge in GaAs1-xBix. Our results provide key insight for clarifying the mechanisms by which isovalent impurities alter the band structure of the host semiconductor.
Original language | American English |
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Article number | Article No. 241201 |
Number of pages | 4 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 92 |
Issue number | 24 |
DOIs | |
State | Published - 14 Dec 2015 |
Bibliographical note
Publisher Copyright:© 2015 American Physical Society.
NREL Publication Number
- NREL/JA-5K00-65508
Keywords
- GaAsBi
- resonant level
- semiconductor optical properties