Abstract
Co-doped ZnO:(Al,N) and ZnO:(Ga,N) films were deposited by co-sputtering using radio-frequency magnetron sputtering on F-doped tin-oxide-coated glass. We found that the ZnO:(Al,N) and ZnO:(Ga,N) films exhibited greatly enhanced crystallinity compared to ZnO:N films doped by pure N and deposited under similar conditions. Furthermore, the ZnO:(Al,N) and ZnO:(Ga,N) films showed much higher N-incorporation than ZnO:N films deposited with pure N doping. As a result, the ZnO:(Ga,N) films showed significantly higher photocurrents than ZnO:N doped only by N. The ZnO:(Cu,Ga) films were synthesized by RF magnetron sputtering in O2 gas ambient at room temperature and then annealed at 500°C in air for 2 hours. We found that the carrier concentration tuning does not significantly change the bandgap and crystallinity of the ZnO:Cu films. However, it can optimize the carrier concentration and thus dramatically enhance PEC response for the bandgap-reduced p-type ZnO thin films.
Original language | American English |
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Pages | 641-649 |
Number of pages | 9 |
DOIs | |
State | Published - 2012 |
Event | 141st Annual Meeting and Exhibition, TMS 2012 - Orlando, FL, United States Duration: 11 Mar 2012 → 15 Mar 2012 |
Conference
Conference | 141st Annual Meeting and Exhibition, TMS 2012 |
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Country/Territory | United States |
City | Orlando, FL |
Period | 11/03/12 → 15/03/12 |
NREL Publication Number
- NREL/CP-5200-55748
Keywords
- Co-doping
- Photoelectrochemical
- Thin film