Dual-Sensor Technique for Characterization of Carrier Lifetime Decay Transients in Semiconductors: Article No. 214510

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages7
JournalJournal of Applied Physics
Volume116
Issue number21
DOIs
StatePublished - 2014

NREL Publication Number

  • NREL/JA-5J00-62687

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