Dynamics of Metal-SiOx and SiOx-Si Interfaces and the Associated Instabilities in Practical Metal/Insulator/Semiconductor Structures

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Number of pages9
    StatePublished - 1983
    EventSymposium on Interfaces and Contacts - Boston, Massachusetts
    Duration: 2 Nov 19824 Nov 1982


    ConferenceSymposium on Interfaces and Contacts
    CityBoston, Massachusetts

    Bibliographical note

    Work performed by Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York

    NREL Publication Number

    • ACNR/CP-3541

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