Dynamics of Metal-SiOx and SiOx-Si Interfaces and the Associated Instabilities in Practical Metal/Insulator/Semiconductor Structures

Dynamics of Metal-SiOx and SiOx-Si Interfaces and the Associated Instabilities in Practical Metal/Insulator/Semiconductor Structures

Research output: Contribution to conference › Paper

Original language	American English
Pages	351-359
Number of pages	9
State	Published - 1983
Event	Symposium on Interfaces and Contacts - Boston, Massachusetts Duration: 2 Nov 1982 → 4 Nov 1982

Conference

Conference	Symposium on Interfaces and Contacts
City	Boston, Massachusetts
Period	2/11/82 → 4/11/82

Bibliographical note

Work performed by Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York

NREL Publication Number

ACNR/CP-3541

Cite this

@conference{6a2ba93f01a64be891c5e2f818289480,

title = "Dynamics of Metal-SiOx and SiOx-Si Interfaces and the Associated Instabilities in Practical Metal/Insulator/Semiconductor Structures",

author = "NREL",

note = "Work performed by Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York; Symposium on Interfaces and Contacts ; Conference date: 02-11-1982 Through 04-11-1982",

year = "1983",

language = "American English",

pages = "351--359",

}

TY - CONF

T1 - Dynamics of Metal-SiOx and SiOx-Si Interfaces and the Associated Instabilities in Practical Metal/Insulator/Semiconductor Structures

AU - NREL, null

N1 - Work performed by Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, New York

PY - 1983

Y1 - 1983

M3 - Paper

SP - 351

EP - 359

T2 - Symposium on Interfaces and Contacts

Y2 - 2 November 1982 through 4 November 1982

ER -