Abstract
Photovoltaic (PV) energy production is experiencing rapid growth, necessitating innovations in module design to enhance cost efficiency, reliability, and recyclability. This study introduces a novel edge-sealed module (ESM) architecture that eliminates traditional vacuum lamination and cross-linked encapsulants. Exellerated testing has been accomplished in collaboration with the National Renewable Energy Laboratory (NREL). Preliminary results demonstrate that this architecture matches the thermal and optical performance of traditional modules, addressing degradation issues such as yellowing, delamination, and potential-induced degradation (PID). Utilizing internal nano-scale textures, the ESM design achieves low reflectance and improved heat dissipation without the need for advanced anti-reflective coatings. Outdoor testing using an in-situ data logger validates the thermal and optical performance of the ESM modules, showing comparable open-circuit voltage (VOC) and short-circuit current (ISC) to conventional modules. This architecture holds promise for meeting the Department of Energy's goal of 50-year module lifespans while enabling cost-effective and sustainable manufacturing practices. Further testing and increased sample sizes are required to refine and validate these findings
| Original language | American English |
|---|---|
| Pages | 1208-1211 |
| Number of pages | 4 |
| DOIs | |
| State | Published - 2025 |
| Event | 2025 IEEE 53rd Photovoltaic Specialists Conference (PVSC) - Montreal, Canada Duration: 8 Jun 2025 → 13 Jun 2025 |
Conference
| Conference | 2025 IEEE 53rd Photovoltaic Specialists Conference (PVSC) |
|---|---|
| City | Montreal, Canada |
| Period | 8/06/25 → 13/06/25 |
NLR Publication Number
- NLR/CP-5K00-98939
Keywords
- adaptive optics
- collaboration
- computer architecture
- degradation
- encapsulation
- glass
- optical device fabrication
- optical reflection
- testing
- voltage