Effect of Cooling Rate During Float-Zoned Silicon Crystal Growth on Minority Carrier Lifetime: (Abstract No. 303)

NREL

    Research output: Contribution to conference › Paper

    Original languageAmerican English
    Number of pages446
    StatePublished - 1986
    Event169th Meeting of the Electrochemical Society - Boston, Massachusetts
    Duration: 4 May 1986 → 9 May 1986

    Conference

    Conference169th Meeting of the Electrochemical Society
    CityBoston, Massachusetts
    Period4/05/86 → 9/05/86

    NREL Publication Number

    • ACNR/CP-212-8605

    Cite this