Abstract
Experimental measurements and continuous-time random walk simulations on sensitized electrolyte-infused porous nanocrystalline TiO2 films show that the actual electronic charge in the films is significantly larger than that estimated from small-perturbation methods by a constant, light-intensity-independent factor. This observation can be explained by small-perturbation techniques measuring thechemical diffusion coefficient of electrons instead of the normally assumed tracer diffusion coefficient of electrons. The difference between the two diffusion coefficients is attributed to the presence of an exponential density of states through which electrons interact. At high light intensities, an additional extra component owing to Coulomb interactions between the electrons is expected toarise.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2005 |
| Event | 2004 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 25 Oct 2004 → 28 Oct 2004 |
Conference
| Conference | 2004 DOE Solar Energy Technologies Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 25/10/04 → 28/10/04 |
Bibliographical note
Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)NREL Publication Number
- NREL/CP-590-37053
Keywords
- continuous-time random-walk (CTRW)
- diffusion coefficients
- dye-sensitized
- electrolyte-infused porous
- nanocrystalline
- photoaccumulated charge
- photocarrier density
- PV
- solar cells