Abstract
Al and N co-doped ZnO thin films, ZnO:(Al,N), are synthesized by radio-frequency magnetron sputtering in mixed Ar and N2 and mixed O2 and N2 gas ambient at 100°C. The ZnO:(Al,N) films deposited in mixed Ar and N2 gas ambient did not incorporate N, whereas ZnO:(Al,N) films deposited in mixed O2 and N2 gas ambient showed enhanced N incorporation and crystallinity as compared to ZnO :N thin films deposited in the same gas ambient. As a result, ZnO:(Al,N) films deposited in mixed O2 and N2 gas ambient showed higher photocurrents than the ZnO:(Al,N) thin films deposited in mixed Ar and N 2 gas ambient. Our results indicate that the gas ambient plays an important role in N incorporation and crystallinity control in Al and N co-doped ZnO thin films.
Original language | American English |
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Pages | 135-142 |
Number of pages | 8 |
DOIs | |
State | Published - 2011 |
Event | TMS 2011 - 140th Annual Meeting and Exhibition - San Diego, California Duration: 27 Feb 2011 → 3 Mar 2011 |
Conference
Conference | TMS 2011 - 140th Annual Meeting and Exhibition |
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City | San Diego, California |
Period | 27/02/11 → 3/03/11 |
NREL Publication Number
- NREL/CP-5200-52606
Keywords
- Band gap
- Co-doping
- Crystallinity
- Gas ambient
- N concentration
- Photoelectrochemical
- RF power
- Sputter
- Substrate temperature
- ZnO
- ZnO:(Al,N)